Magnetization-induced changes of reflected second-harmonic signals from thi
n Co and Ni films on Cu(001) were measured as a function of film thickness
during film growth for substrate temperatures of 80 degrees C and 45 degree
s C, respectively. The film thickness was controlled by medium energy elect
ron diffraction. The onset of ferromagnetic coupling was recorded and the r
eorientation from in-plane to out-of-plane magnetization was studied for Ni
films at various temperatures.