Application of linearly independent arithmetic transform in testing of digital circuits

Recently introduced linearly independent arithmetic transforms and their co rresponding spectral coefficients are used to detect faults in digital circ uits. The results show that for many classes of logical functions, the LIA logic transformations are advantageous in terms of the number of their coef ficients that have to be checked to identify the faults when compared to th e case of the well-known arithmetic transform.