Citation
V. Vaicikauskas et al., Determination of plasma frequency and the pulse relaxation time in doped semiconductors by FIR surface waves, INT J INFRA, 20(3), 1999, pp. 439-445
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES
ISSN journal
01959271
→ ACNP
Volume
20
Issue
3
Year of publication
1999
Pages
439 - 445
Database
ISI
SICI code
0195-9271(199903)20:3<439:DOPFAT>2.0.ZU;2-1
Abstract
The Surface Electromagnetic waves method was applied for determination of p
lasma frequency and pulse relaxation time in doped A(3)B(5) semiconductors.
The influence of plasmon phonon interaction, nonparabolity of the conducti
on band, electron scattering peculiarities, presence of disturbed layers ar
e under consideration.