This article addresses the subtle changes necessary to achieve a margin aga
inst an intrinsic failure mechanism in a highly time-constrained developmen
t would. The problem of a coefficient of thermal expansion mismatch between
a liquid crystal polymer connector and a FR4 substrate was exacerbated by
the size, dimensions, and ball-grid array attachment for such a connector.
By carefully controlling the solder-mask wall profile, opening, and overhan
g, if was possible to avoid the time- and resource-consuming option of chan
ging the connector materials.