New observation method for divergent beam X-ray diffraction patterns

The simultaneous observation of X-ray reflections by a high-quality charge coupled device (CCD) camera in a scanning electron microscope is presented. The possibility of immediate further processing and evaluation of the imag es by computer, avoiding the extensive photographic X-ray film procedure, i s discussed. The divergent beam X-ray method has considerable importance fo r investigations in materials research. The experimental set-up is describe d and the advantageous application of the camera is demonstrated for differ ent examples.