Propagation losses of copper-ion-exchanged channel optical waveguides

We have measured the propagation losses of Cu-Na-ion-exchanged channel glas s waveguides using both scattering and interferometric methods. In the firs t method, the waveguide was coated with a fluorescence film to enhance the scattered optical field along the channel waveguide which was then captured by a charge-coupled device camera. A straight line is adjusted to the inte nsity profile by the least-squares method, and the slope yields the attenua tion coefficient. In the interferometric method, the temperature of the wav eguides was changed and the intensity output was measured. From contrast ch anges of waveguide's intensity output, the attenuation coefficient is calcu lated. Also, an analysis of the optical absorption of copper waveguides in the 200-1900 nm range to detect the copper oxidation state is presented.