Simple method for determining the parameters of optical films

This paper presents a quick, simple method of determining the parameters (t he refractive index and thickness) of dielectric films used in constructing optical coatings. The method is based on measuring the ratio of the reflec tances of the p- and s-polarized components of the radiation at different a ngles of incidence by means of an attachment to the spectrophotometer. The accuracy with which the film parameters are measured is estimated. (C) 1999 The Optical Society of America. [S1070-9762(99)01102-1].