Hard x-ray quantitative non-interferometric phase-contrast microscopy

Citation
Te. Gureyev et al., Hard x-ray quantitative non-interferometric phase-contrast microscopy, J PHYS D, 32(5), 1999, pp. 563-567
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN journal
00223727 → ACNP
Volume
32
Issue
5
Year of publication
1999
Pages
563 - 567
Database
ISI
SICI code
0022-3727(19990307)32:5<563:HXQNPM>2.0.ZU;2-Y
Abstract
We report the results of quantitative phase-contrast imaging experiments us ing synchrotron radiation, in-line imaging geometry and a non-interferometr ic phase retrieval technique. This quantitative imaging method is fast, sim ple, robust, does not require sophisticated x-ray optical elements and can potentially provide submicron spatial resolution over a field of view of th e order of centimetres. In the present experiment a spatial resolution of a pproximately 0.8 mu m has been achieved in images of a polystyrene sphere u sing 19.6 keV x-rays. We demonstrate that appropriate processing of phase-c ontrast images obtained in the in-line geometry can reveal important new in formation about the internal structure of weakly absorbing organic samples. We believe that this technique will also be useful in phase-contrast tomog raphy.