Ni content and grain size dependency of perovskite structure La0.8Sr0.2Co1-xNixO3-delta thin films for CO gas sensor

Citation
Cm. Chiu et Yh. Chang, Ni content and grain size dependency of perovskite structure La0.8Sr0.2Co1-xNixO3-delta thin films for CO gas sensor, J VAC SCI A, 17(2), 1999, pp. 630-634
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
17
Issue
2
Year of publication
1999
Pages
630 - 634
Database
ISI
SICI code
0734-2101(199903/04)17:2<630:NCAGSD>2.0.ZU;2-P
Abstract
La0.8Sr0.2Co1-xNixO3-delta perovskite films prepared by the radio frequency sputtering technique in a wide range of Ni content (x less than or equal t o 0.6) were studied. The microstructure of the films determined by scanning electron microscopy showed the changing of grain size after heat treatment at different temperature for 5 h. The effect of Ni doping on the sensitivi ty to CO was studied. The La0.8Sr0.2Co0.6Ni0.4O3-delta film treated at 700 degrees C for 5 h shows the best improvement of sensitivity to CO. The CO-O -2 reaction on the surface of film can be indirectly probed by electron spe ctroscopy for chemical analysis. The sensitivity dependence affected by gra in size is also investigated. The combination of binding energy to the adso rbed oxygen and the connecting condition of the adjacent grains would domin ate the sensing property. The results, show the La0.8Sr0.2Co0.6Ni0.4O3-delt a film treated at 700 degrees C for 5 h yields the maximum sensitivity of 1 0.1% in 50 ppm of CO. (C) 1999 American Vacuum Society. [S0734-2101(99)0170 2-9].