1.5 mu m infrared photoluminescence phenomena in Er-doped porous silicon

Citation
M. Stepikhova et al., 1.5 mu m infrared photoluminescence phenomena in Er-doped porous silicon, APPL PHYS L, 74(4), 1999, pp. 537-539
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
4
Year of publication
1999
Pages
537 - 539
Database
ISI
SICI code
0003-6951(19990125)74:4<537:1MMIPP>2.0.ZU;2-6
Abstract
We analyze the photoluminescence (PL) in nanoporous Si (po-Si) doped with E r by electrochemical deposition and by spin-on doping. Two kinds of optical ly active Er centers appear in electrochemically doped po-Si with the main sharp and intense lines at 1.548 and 1.539 mu m, respectively. The features characteristic for the spin-on doping method are: intense dislocation-rela ted PL at 1.53 mu m and strong luminescent activity of the silica gel used for Er doping. High-temperature PL observed up to 360 K is attributed to Er centers incorporated in the silica-like matrix at the oxidized surface of electrochemically doped po-Si and in erbium-containing silica gel. (C) 1999 American Institute of Physics. [S0003-6951(99)01804-5].