Optical characterization of the "E2" deep level in GaN

Citation
P. Hacke et al., Optical characterization of the "E2" deep level in GaN, APPL PHYS L, 74(4), 1999, pp. 543-545
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
4
Year of publication
1999
Pages
543 - 545
Database
ISI
SICI code
0003-6951(19990125)74:4<543:OCOT"D>2.0.ZU;2-3
Abstract
The correspondence between the E2 level (similar to E-c-0.55 eV) in n-type GaN undergoing thermoionization and photoionization was established. The op tical cross section in the vicinity of the threshold for photoionization of this level was measured by means of capacitance transient spectroscopy. An alysis using the formulation of Chantre yielded the optical activation ener gy, E-0=0.85 eV, and the Franck-Condon parameter, d(FC)=0.30 eV at 90 K. (C ) 1999 American Institute of Physics. [S0003-6951(99)03004-1].