Influence of the surface morphology on the yellow and "edge" emissions in wurtzite GaN

Citation
M. Godlewski et al., Influence of the surface morphology on the yellow and "edge" emissions in wurtzite GaN, APPL PHYS L, 73(25), 1998, pp. 3686-3688
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
25
Year of publication
1998
Pages
3686 - 3688
Database
ISI
SICI code
0003-6951(199812)73:25<3686:IOTSMO>2.0.ZU;2-4
Abstract
In this letter we examine an influence of surface morphology on yellow and edge emissions in wurtzite phase GaN. Our cathodoluminescence measurements show that the yellow emission does not correlate with the surface morpholog y, but simultaneously the "edge" emission shows very strong spatial fluctua tions. The observed effect is attributed to granular structures in GaN film s and enhancement of the yellow emission in the interface region. (C) 1998 American Institute of Physics. [S00003-6951(98)00751-7].