Cation vacancy formation and migration in the AlGaAs heterostructure system

Citation
P. Mitev et al., Cation vacancy formation and migration in the AlGaAs heterostructure system, APPL PHYS L, 73(25), 1998, pp. 3718-3720
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
25
Year of publication
1998
Pages
3718 - 3720
Database
ISI
SICI code
0003-6951(199812)73:25<3718:CVFAMI>2.0.ZU;2-J
Abstract
A simple experimental approach has been employed to obtain thermochemical p arameters for cation vacancy formation and migration in the AlGaAs heterost ructure system. Cation vacancies are injected into the free surface by anne aling under an arsenic-rich ambient. Their presence is detected by monitori ng the local rate of Al-Ga interdiffusion at imbedded quantum well markers. The sample is unusually thick allowing us to separately identify contribut ions from the vapor, epilayer, and substrate phases. The entropies and enth alpies of vacancy formation and migration are (5.2 +/- 5.7) k(B) and (1.8 /- 0.5) eV and (11.3 +/- 4.4) k(B) and (3.3 +/- 0.4) eV, respectively. (C) 1998 American Institute of Physics. [S0003-6951(98)02051-8].