HIGH-SPEED INGAAS METAL-SEMICONDUCTOR-METAL PHOTODETECTORS WITH THIN ABSORPTION LAYERS

Citation
Wa. Wohlmuth et al., HIGH-SPEED INGAAS METAL-SEMICONDUCTOR-METAL PHOTODETECTORS WITH THIN ABSORPTION LAYERS, IEEE photonics technology letters, 9(5), 1997, pp. 654-656
Citations number
8
Categorie Soggetti
Optics,"Physics, Applied
ISSN journal
10411135
Volume
9
Issue
5
Year of publication
1997
Pages
654 - 656
Database
ISI
SICI code
1041-1135(1997)9:5<654:HIMPWT>2.0.ZU;2-R
Abstract
The responsivity and the bandwidth of metal-semiconductor-metal photod etectors (MSMPD's) with different InGaAs absorption layer thicknesses and electrode geometries were investigated, By decreasing the InGaAs t hickness from 1.0 to 0.25 mu m, the bandwidth was found to increase by approximately a factor of 2, while the responsivity was found to decr ease by almost a factor of 3 from 0.29 to 0.10 A/W at a bias of -5 V. Devices with an electrode width and spacing of 1 mu m and a 0.25-mu m absorption layer displayed a bandwidth of 19.5 GHz when biased at -15 V under front-side illumination with 1.55-mu m light.