Antiguided array lasers were fabricated in thin p-clad, InGaAs-GaAs single
quantum-well material. The required lateral refractive index variation was
achieved by precisely modulating the thickness of the GaAs cap layer using
a novel pulsed anodization/etching technique. Edge-emitting arrays having 2
0 lasers on 7-mu m centers with 5-mu m-wide gain regions were characterized
, At 1.2 times the pulsed current threshold (I-th). the central lobe of the
lateral far field of the arrays contained about 75% of the beam power and
was about twice the diffraction limit (FWHM = 0.8 degrees). At 10 x I-th, t
he central lobe contained about 60% of the beam power and was about 1.6 deg
rees wide.