Field-induced functions of porous Si as a confined system

Citation
N. Koshida et al., Field-induced functions of porous Si as a confined system, J LUMINESC, 80(1-4), 1998, pp. 37-42
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF LUMINESCENCE
ISSN journal
00222313 → ACNP
Volume
80
Issue
1-4
Year of publication
1998
Pages
37 - 42
Database
ISI
SICI code
0022-2313(199812)80:1-4<37:FFOPSA>2.0.ZU;2-N
Abstract
Electroluminescent porous Si (PS) diodes exhibit various useful functions u nder a high-electric held. The experimental PS diodes are composed of thin semitransparent metal films, PS layers (about 500 nm thick in minimum), p- or n-type Si substrates and ohmic back contacts. Definite nonlinear electri cal behavior (negative resistance and nonvolatile bistable memory effects) and cold electron emission phenomena appear in these PS diodes associated w ith the EL emission. Both the negative resistance and memory effects are re lated to the charging of Si nanocrystallites by held-induced carrier inject ion. The electron emission observed in the PS diodes formed on n + -Si subs trates is caused by hot electrons tunnelling through the top contact. By an appropriate structural control of PS, the effective drift length under a h igh-field conduction is significantly increased, and then electrons are emi tted ballistically. These functions reflect the activity of PS as a nanocry stalline confined system. (C) 1999 Published by Elsevier Science B.V. All r ights reserved.