The effect of annealing under hydrostatic pressure on the visible photoluminescence from Si+-ion implanted SiO2 films

Citation
Ie. Tyschenko et al., The effect of annealing under hydrostatic pressure on the visible photoluminescence from Si+-ion implanted SiO2 films, J LUMINESC, 80(1-4), 1998, pp. 229-233
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF LUMINESCENCE
ISSN journal
00222313 → ACNP
Volume
80
Issue
1-4
Year of publication
1998
Pages
229 - 233
Database
ISI
SICI code
0022-2313(199812)80:1-4<229:TEOAUH>2.0.ZU;2-L
Abstract
We have studied the influence of the hydrostatic pressure during annealing on the intensity of the visible photoluminescence (PL) from thermally grown SiO2 films irradiated with Si (+) ions. Post-implantation anneals have bee n carried out in an Ar ambient at temperatures T-a of 400 degrees C and 450 degrees C for 10 h and 1130 degrees C for 5 h at hydrostatic pressures of I bar-15 kbar. It has been found that the intensity of the 360, 460 and 600 nm PL peaks increases with rising hydrostatic pressure during low-temperat ure annealing. The intensity of the short-wavelength PL under conditions of hydrostatic pressure continues to rise even at T-a = 1130 degrees C. Incre asing T-a leads to a shift in the PL spectra towards the ultraviolet range. The results obtained have been interpreted in terms of enhanced, pressure- mediated formation of =Si-Si= centres and small Si clusters within metastab le regions of the ion-implanted SiO2. (C) 1999 Elsevier Science B.V. All ri ghts reserved.