X-ray photoemission electron microscopy (XPEEM) as a new promising tool for the real-time chemical imaging of active surfaces

Authors
Yamaguchi, Y Takakusagi, S Sakai, Y Kato, M Asakura, K Iwasawa, Y
Citation
Y. Yamaguchi et al., X-ray photoemission electron microscopy (XPEEM) as a new promising tool for the real-time chemical imaging of active surfaces, J MOL CAT A, 141(1-3), 1999, pp. 129-137
Citations number
62
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF MOLECULAR CATALYSIS A-CHEMICAL
ISSN journal
13811169 → ACNP
Volume
141
Issue
1-3
Year of publication
1999
Pages
129 - 137
Database
ISI
SICI code
1381-1169(19990506)141:1-3<129:XPEM(A>2.0.ZU;2-P
Abstract
We have developed a XPEEM (X-ray photoemission electron microscopy) for a n ew surface imaging. XPEEM is a PEEM using X-ray as an excitation source and installed with an energy filter to select an X-ray photoelectron peak spec ific to the target atoms. XPEEM can image the distribution of elements, che mical states and chemical species at the working surface in a mesoscopic sc ale. (C) 1999 Elsevier Science B.V. All rights reserved.