A low-profile monolithic multi-element Ge detector for X-ray fluorescence applications

Citation
G. Derbyshire et al., A low-profile monolithic multi-element Ge detector for X-ray fluorescence applications, J SYNCHROTR, 6, 1999, pp. 62-63
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF SYNCHROTRON RADIATION
ISSN journal
09090495 → ACNP
Volume
6
Year of publication
1999
Part
2
Pages
62 - 63
Database
ISI
SICI code
0909-0495(19990301)6:<62:ALMMGD>2.0.ZU;2-D
Abstract
A highly compact and rapid-count-rate multi-element solid-state detector ha s been designed, built and recently commissioned on the oldest XAFS station of the SRS, station 7.1, which has undergone major refurbishment. The low profile of the detector has been achieved by using the monolithic solution where nine elements with a combined active area of 370 mm(2) have been fabr icated on Ge of diameter 21.8 mm. A typical energy resolution of 170 eV wit h a semi-Gaussian shaping time of 0.5 mu s has been achieved with X-rays of energy 5.9 keV. The low profile of the detector makes it ideal for several synchrotron radiation applications as it can be easily incorporated into c omplicated experimental set-ups. These include XAFS of single crystals and samples generated in a stopped Bow system, protein crystallography (fluores cence XAFS for MAD or for on-line monitoring), microprobe fluorescence imag ing and trace-element analysis.