Nn. Feng et al., Modified method of lines for open microstrip structures with finite metallization thickness and conductivity, MICROW OPT, 21(1), 1999, pp. 60-63
A modified method of lines (MMoL) is developed to analyze open microstrip s
tructures with finite metallization thickness and conductivity. The integra
tion along the normal of the interface between the conductor and dielectric
is analytically integrated before the method of lines transform. The perio
dic boundary conditions (PBC) are employed to simulate the open structure.
Due to the uniform descretization which leads to the analytical form to eig
envalues and the application of the fast Fourier transform (FFT) technique,
our approach can reduce the computation time significantly. The comparison
between our results and published theoretical or experimental ones shows t
he accuracy and efficiency of this method. (C) 1999 John Wiley & Sons, Inc.