Thin films of CdS nanoparticles of different crystalline sizes have been gr
own by a precipitation technique and characterized by PIXE, RES, AFM, SEM,
XRD and optical absorption studies. PIXE studies identify the presence of C
d and S and indicate the absence of any foreign impurity even at ppm level,
whereas RBS analysis identifies excess Cd in nano-CdS deposit. The bulk-Cd
S gave stoichiometric CdS film. XRD analysis show presence of mixed cubic a
nd hexagonal phases for bulk CdS films, whereas for nano-CdS samples predom
inantly a cubic phase have been identified. AFM and SEM analysis show a rou
gh and spongy morphology for all the samples which increases with increasin
g crystalline size/thickness, From AFM and optical absorption studies, the
geometry of the nanoparticles is predicted to be non-spherical. (C)1999 Act
a Metallurgica Inc.