Thin films of the heavy-fermion compound CeCu6 were prepared by co-sputteri
ng from two high-purity targets of Ce and Cu. We used electron probe microa
nalysis and Rutherford backscattering to determine composition and thicknes
s, Auger electron spectroscopy for depth profile analysis and X-ray diffrac
tion to check crystallinity. The films were found to be of high quality. Re
sistivity and magnetoresistance measurements as a function of temperature (
0.03-300 K) on films of thicknesses ca. 200 nm mimic the properties of bulk
CeCu6. Based upon these transport measurements we have evidence for the fo
rmation of a strongly correlated electron state in our films. (C) 1999 Else
vier Science B.V. All rights reserved.