Magnetic properties of UPd2Al3 thin films investigated by resonant magnetic X-ray scattering

Thin films with thicknesses varying from 100 to 1600 Angstrom of the magnet ic heavy-fermion superconductor UPd2Al3 have been investigated by resonant magnetic X-ray scattering. All films studied show the same antiferromagneti c structure as the bulk material. The magnetic order seems to develop initi ally on the surface of the film and penetrates into the him on lowering the temperature. In the hexagonal c direction (film growth direction) the magn etic correlations extend over the complete film thickness at low temperatur e. The magnetic correlation lengths in the plane of the him are approximate ly equal to those along the c-axis. (C) 1999 Elsevier Science B.V. All righ ts reserved.