Resonant inelastic X-ray scattering from highly correlated Ce multilayers

Authors
Mariot, JM Gallet, JJ Journel, L Hague, CF Felsch, W Krill, G Sacchi, M Kappler, JP Rogalev, A Goulon, J
Citation
Jm. Mariot et al., Resonant inelastic X-ray scattering from highly correlated Ce multilayers, PHYSICA B, 261, 1999, pp. 1136-1137
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
261
Year of publication
1999
Pages
1136 - 1137
Database
ISI
SICI code
0921-4526(199901)261:<1136:RIXSFH>2.0.ZU;2-R
Abstract
The 2p(6) --> 2p(5)(4f5d)(+1) --> 2p(6)3d(9)(4f5d)(+1) resonant inelastic X -ray scattering (RIXS) process is studied in [(5 Angstrom) La/ (10 Angstrom ) Ce/(5 Angstrom) La/(30 A) Fe] x n multilayers. RIXS is a bulk sensitive p robe which, as shown here, provides information on the correlation energies in mixed-valent cerium systems. (C) 1999 Elsevier Science B.V. All rights reserved.