Low energy hydrogen ion implantation in ZnO creates an accumulation layer n
ear the surface, giving rise to a quantum well. The corresponding self-cons
istent Hartree problem is solved by taking into account the donor distribut
ion resulting from the implantation process. The values of the surface pote
ntial as a function of repelled away electron concentration are derived. Th
e resulting data are compared with experimental values obtained from space-
charge capacitance measurements. A comparative study between the semi-class
ical and self-consistent quantum treatments is presented.