Pattern formation during delamination and buckling of thin films

Citation
Km. Crosby et Rm. Bradley, Pattern formation during delamination and buckling of thin films, PHYS REV E, 59(3), 1999, pp. R2542-R2545
Citations number
21
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW E
ISSN journal
1063651X → ACNP
Volume
59
Issue
3
Year of publication
1999
Part
A
Pages
R2542 - R2545
Database
ISI
SICI code
1063-651X(199903)59:3<R2542:PFDDAB>2.0.ZU;2-6
Abstract
Using a-simple lattice model, we study the failure of compressively straine d thin films on solid substrates. Our simulations reproduce much of the obs erved phenomenology of thin film blistering. In particular, we observe a pe culiar form of stress relief in which a wrinkle of delaminated film propaga tes along a sinusoidal path. At higher intrinsic strains, the sinusoidal wr inkles bifurcate, forming branches. Finally, we identify a high-strain regi me in which the film delaminates by forming a buckling front with many irre gular lobes. [S1063-651X(99)50603-X].