Thin nematic films: Metastability and spinodal dewetting

Citation
F. Vandenbrouck et al., Thin nematic films: Metastability and spinodal dewetting, PHYS REV L, 82(13), 1999, pp. 2693-2696
Citations number
20
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
82
Issue
13
Year of publication
1999
Pages
2693 - 2696
Database
ISI
SICI code
0031-9007(19990329)82:13<2693:TNFMAS>2.0.ZU;2-E
Abstract
We present new results about the stability of 5CB nematic films spun cast o nto silicon wafers. We observe experimentally the dewetting of thin films w hile thick ones remain stable. We interpret this behavior as a competition between elasticity and van der Waals forces. At later stages, the experimen tally observed dewetting instability leads to the formation of structures ( islands) which grow and finally merge to form a film of uniform thickness, We show that the islands' characteristic size L(t) scales as t(1/3) as expe cted from late stage growth theories. [S0031-9007(99)08781-5].