Infrared, Raman and XPS studies of vanadate glasses containing Ga2O3

Vanadate glasses containing Ga2O3 have been investigated by. means of FTIR, Raman and x-ray photoelectron (XPS) spectroscopy. Upon increasing gallium oxide content, the layer like matrix of pure V2O5 glass adopts a new struct ural arrangement comprising edge shared VO5 trigonal bipyramids and VO4 tet rahedra. The vibrations at similar to 1100, 1060 anti 1000 cm(-1) in the FT IR spectra suggest the presence of short vanadyl bonds in these groups. The strong Raman mode at 800 cm(-1) has been associated with the vibrations of a substantial fraction of VO4 tehrahedra. The constant activity of the Ram an mode at 700 cm(-1) shows that VO5 units are connected by means of edges Since the vanadyl bond wavenumber is not lowered the Ga3+ ions are assumed to occupy substitutional sites in the glass network. The two O Is XPS peaks hare been assigned to oxygen atoms in different coordination states The po or glass formation ability can be related re both the edge sharing of VO5 u nits and the cluster like GaOx units resembling beta-Ga2O3 crystal.