Determination of the complex refractive inner of thermally evaporated thinfilms of binary chalcogenide glasses by reflectance measurements

Citation
E. Marquez et al., Determination of the complex refractive inner of thermally evaporated thinfilms of binary chalcogenide glasses by reflectance measurements, PHYS C GLAS, 40(1), 1999, pp. 18-25
Citations number
36
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
PHYSICS AND CHEMISTRY OF GLASSES
ISSN journal
00319090 → ACNP
Volume
40
Issue
1
Year of publication
1999
Pages
18 - 25
Database
ISI
SICI code
0031-9090(199902)40:1<18:DOTCRI>2.0.ZU;2-W
Abstract
The optical constants of thermally evaporated binary chalcogenide glass thi n films of chemical compositions As25S75 and Ge33Se67 were obtained in the 400-2200 nm spectral region using a method proposed by Minkov based on the maxima and minima envelopes of the reflection spectrum. The real and imagin ary parts of the complex refractive inner, n and k respectively and the fil m thickness, d, were derived from the experimental spectra and the results were cross checked by using a surface profiling stylus to measure the film thickness. Dispersion of n is discussed in terms of the single oscillator W emple-DiDomenico model and optical band gaps are determined front absorptio n coefficients using Tauc's procedure.