Implementation of scanning electron microscopy with polarization analysis using high-efficiency retarding-potential Mott polarimeters

Authors
Barnes, J Mei, L Lairson, BM Dunning, FB
Citation
J. Barnes et al., Implementation of scanning electron microscopy with polarization analysis using high-efficiency retarding-potential Mott polarimeters, REV SCI INS, 70(1), 1999, pp. 246-247
Citations number
9
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
1
Year of publication
1999
Part
1
Pages
246 - 247
Database
ISI
SICI code
0034-6748(199901)70:1<246:IOSEMW>2.0.ZU;2-P
Abstract
The application of a compact high-efficiency retarding-potential Mott polar imeter in scanning electron microscopy with polarization analysis (SEMPA) i s described. Such polarimeters, which combine high-efficiency with large el ectron optical acceptance and stable long-term operation, are shown to be p articularly attractive for use in SEMPA. (C) 1999 American Institute of Phy sics. [S0034-6748(99)03601-1].