Fabrication of free standing structure using single step electrochemical etching in hydrofluoric acid

Citation
H. Ohji et al., Fabrication of free standing structure using single step electrochemical etching in hydrofluoric acid, SENS ACTU-A, 73(1-2), 1999, pp. 95-100
Citations number
15
Categorie Soggetti
Instrumentation & Measurement
Journal title
SENSORS AND ACTUATORS A-PHYSICAL
ISSN journal
09244247 → ACNP
Volume
73
Issue
1-2
Year of publication
1999
Pages
95 - 100
Database
ISI
SICI code
0924-4247(19990309)73:1-2<95:FOFSSU>2.0.ZU;2-X
Abstract
This paper presents a new technique of micromachining using single step ele ctrochemical etching in hydrofluoric acid (HF). The electrochemical etching in HF is known as a technique for porous silicon formation. This etching t echnique is applied to fabricate 3-D structures in single crystal silicon b y a combination of anisotropic and isotropic modes. The diameter of the por e, or the width of the trench, can be controlled by the current density. Fi rst, vertical walls are formed and after desired depth is obtained, current density is increased by adjusting the light intensity. The width of the tr enches is increased under the structures without affecting the width of exi sting trenches. The connection of the trenches can be achieved and free sta nding beams obtained with only one mask. The free standing beams with heigh t, width and length of 40 mu m, 2 mu m and 250 mu m, respectively, have bee n made of single crystal silicon. (C) 1999 Elsevier Science S.A. All rights reserved.