A pulsed TEA-CO2 laser in combination with the dynamic fluidized bed powder
feeder was employed to deposit a thin CeO2 buffer layer on the polycrystal
line Ni-substrate in a non-vacuum environment. Use of the 30 degrees powder
jet inclination with respect to the laser beam axis along with the nano si
ze precursor powder deposited a smooth layer on the entire surface of the s
ubstrate. Both EDS and X-ray diffractometry analyses were employed to confi
rm the stoichiometric nature of the deposited CeO2 buffer layer. (C) 1999 E
lsevier Science S.A. All rights reserved.