Zx. Ma et al., STRONG VISIBLE PHOTOLUMINESCENCE FROM AMORPHOUS-SILICON GRAINS IN A-SIOX-H FILMS, Solid state communications, 104(10), 1997, pp. 587-591
Two strong luminescence bands were observed from a-SiOx:H in the spect
ral range of 550-900 nm at room temperature. One is a main broad peak
which blueshifts with oxygen content and the other is a shoulder fixed
at about 835 nm. In conjunction with TR and micro-Raman spectra, we h
ave proposed that the main band may originate from the amorphous silic
on grains embedded in SiOx network, while the shoulder might be due to
some defects induced by excess-silicon in these films. (C) 1997 Elsev
ier Science Ltd.