A BRILLIANT FUTURE FOR MICROANALYSIS

The ability to measure trace element distributions on the microscale i s often critical to our understanding of large scale geological proces ses, As the number of different instruments and techniques capable of trace element analysis increases the choice of analytical method is be coming less clear. Although most techniques have 1 micrometre spatial resolution as their ultimate goal It is clear that the analytical dept h is determined by sample thickness (proton probe and synchrotron XRF) or analytical volume (ion probe and laser ablation-ICP-MS) considerat ions, Thus ability to produce brighter and smaller beams also requires significant improvement in the detection of secondary particles. Prov ided analytical considerations, such as precision or detectibility are met, tile eventual choice between competing techniques may well be mo re mundane aspects such as ease of access and cost.