AFM OPERATING MODE WITH A CONSTANT FORCE PROJECTION ONTO THE ARBITRARY AXIS

The scanning of the AFM tip above the surface of close-packed crystal is considered. The surfaces of constant force projection are calculate d onto the arbitrary axis inclined at some angle to the vertical direc tion. It has been shown that the relief depth of such constant force s urfaces is larger than for the generally used ones, for which the valu e of the vertical force component is constant. Both the case of perfec t crystal and of crystal with point surface defects are investigated.