A study of the main failure mechanisms in vacuum vapor-deposited organ
ic light-emitting diodes (LED's) is presented. Three degradation modes
were identified for a prototype bilayer ITO/TPD/Alq(3)/Mg/Ag device:
a) formation and growth of black nonemissive spots, b) abrupt ceasing
of light emission associated with catastrophic failures caused by elec
trical shorts, and c) long term wearout associated with the decrease o
f quantum efficiency and luminance along with an increase in voltage,
while the device is stressed under constant current.