MEASUREMENT OF THE OPTICAL FUNCTIONS OF UNIAXIAL MATERIALS BY 2-MODULATOR GENERALIZED ELLIPSOMETRY - RUTILE (TIO2)

Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the element s of the normalized Jones matrix with one measurement and thereby tota lly characterizes light reflecting from the sample. If a uniaxial crys tal is appropriately aligned, then determining its optical functions r equires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate availab le for optical energies above the band edge. (C) 1997 Optical Society of America.