BALLISTIC-ELECTRON-EMISSION MICROSCOPY ON QUANTUM WIRES

Citation
J. Smoliner et al., BALLISTIC-ELECTRON-EMISSION MICROSCOPY ON QUANTUM WIRES, Physica status solidi. b, Basic research, 204(1), 1997, pp. 386-392
Citations number
14
ISSN journal
03701972
Volume
204
Issue
1
Year of publication
1997
Pages
386 - 392
Database
ISI
SICI code
0370-1972(1997)204:1<386:BMOQW>2.0.ZU;2-F
Abstract
In this paper ballistic electron emission microscopy (BEEM) studies on quantum wire structures are reported. Ln these experiments the quantu m wires are directly observed both in sample topography and the BEEM c urrent images. Especially at liquid helium temperatures, the BEEM curr ent is found to be enhanced if the ballistic electrons are injected di rectly into the wire region. In the etched areas between the wires. th e effective surface barrier height is found to be larger than on the w ires. From the low temperature BEEM spectra we conclude, that diffusiv e scattering processes dominate the carrier transport across the Au/Ga As interface.