U. Hohenester et al., A TRANSPORT ANALYSIS OF THE BEEM SPECTROSCOPY OF AU SI SCHOTTKY BARRIERS/, Physica status solidi. b, Basic research, 204(1), 1997, pp. 397-399
A systematic transport study of the ballistic electron emission micros
copy (BEEM) of Au/Si(100) and Au/Si(lll) Schottky barriers for differe
nt thicknesses of the metal layer and different temperatures is presen
ted. It is shown that the existing experimental data are compatible wi
th a recently predicted band structure-induced non-forward electron pr
opagation through the Au(lll) layer.