We have measured the mechanical properties of single-crystal silicon d
oped with boron (acceptor) impurities. A low-temperature doping-depend
ent increase in dissipation is observed, accompanied by a period shift
. With increasing magnetic field, the dissipation and period shift are
eliminated. These results confirm an electronic origin for the dissip
ation, consistent with the attenuation observed elsewhere in ultrasoun
d in boron-doped silicon.