CHARACTERIZATION OF CRYSTAL SYSTEM OF BAPB1-XBIXO3 WITH X-RAY-DIFFRACTION FOR SYNCHROTRON-RADIATION

Citation
T. Hashimoto et al., CHARACTERIZATION OF CRYSTAL SYSTEM OF BAPB1-XBIXO3 WITH X-RAY-DIFFRACTION FOR SYNCHROTRON-RADIATION, Solid state communications, 102(7), 1997, pp. 561-564
Citations number
13
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
102
Issue
7
Year of publication
1997
Pages
561 - 564
Database
ISI
SICI code
0038-1098(1997)102:7<561:COCSOB>2.0.ZU;2-W
Abstract
Crystal symmetry and lattice constants of BaPb1-xBixO3 were analyzed b y X-ray diffraction using synchrotron radiation as a light source. Mea surements with high resolution could be carried out and crystal system of BaPb1-xBixO3 could be determined clearly. Monoclinic and orthorhom bic symmetry were observed in the x range 0.5 less than or equal to x less than or equal to 1.0 and 0.0 less than or equal to x less than or equal to 0.5, respectively, showing agreement with the electrical con duction behavior and optical reflection property of BaPb1-xBixO3. (C) 1997 Elsevier Science Ltd.