DATA-DRIVEN SELF-TIMED RSFQ HIGH-SPEED TEST SYSTEM

Authors
DENG ZJ YOSHIKAWA N WHITELEY SR VANDUZER T
Citation
Zj. Deng et al., DATA-DRIVEN SELF-TIMED RSFQ HIGH-SPEED TEST SYSTEM, IEEE transactions on applied superconductivity, 7(4), 1997, pp. 3830-3833
Citations number
8
Journal title
IEEE transactions on applied superconductivity → ACNP
ISSN journal
10518223
Volume
7
Issue
4
Year of publication
1997
Pages
3830 - 3833
Database
ISI
SICI code
1051-8223(1997)7:4<3830:DSRHTS>2.0.ZU;2-J
Abstract
Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses, This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test syste m based on data-driven self-timed (DDST) circuits.