APPLICATIONS OF A PHOTOION-PHOTOION-COINCIDENCE TECHNIQUE TO THE STUDY OF PHOTON-STIMULATED ION-DESORPTION PROCESS FOLLOWING K-SHELL EXCITATION

Authors
SEKIGUCHI T SEKIGUCHI HI TANAKA K
Citation
T. Sekiguchi et al., APPLICATIONS OF A PHOTOION-PHOTOION-COINCIDENCE TECHNIQUE TO THE STUDY OF PHOTON-STIMULATED ION-DESORPTION PROCESS FOLLOWING K-SHELL EXCITATION, Surface science, 390(1-3), 1997, pp. 199-203
Citations number
11
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
390
Issue
1-3
Year of publication
1997
Pages
199 - 203
Database
ISI
SICI code
0039-6028(1997)390:1-3<199:AOAPTT>2.0.ZU;2-R
Abstract
We have investigated the photon-stimulated ion-desorption from deutera ted formic acid (DCOOD) monolayer chemisorbed on Si(100) crystal by ap plying a photoion-photoion-coincidence technique. The true-coincidence yields of an ion pair C+-D+ are given in the photon energy range (275 -400 eV) above the C 1s absorption edge. The partial ion yields and Au ger electron yields re presented for comparison. It was found that the multielectron (shake-off) excitation promotes the multiple bond-break ing of the adsorbate and the ion pair C+-D+ desorption events. (C) 199 7 Elsevier Science B.V.