A TEM METHOD FOR ACCURATE MEASUREMENT OF HABIT PLANE (INTERFACE) - DOUBLE EDGE-ON TRACE ANALYSIS

Authors
LUO CP XIAO XL WU DX
Citation
Cp. Luo et al., A TEM METHOD FOR ACCURATE MEASUREMENT OF HABIT PLANE (INTERFACE) - DOUBLE EDGE-ON TRACE ANALYSIS, Progress in Natural Science, 7(6), 1997, pp. 742-748
Citations number
5
Journal title
Progress in Natural Science → ACNP
ISSN journal
10020071
Volume
7
Issue
6
Year of publication
1997
Pages
742 - 748
Database
ISI
SICI code
1002-0071(1997)7:6<742:ATMFAM>2.0.ZU;2-S
Abstract
A method oi trace analysis, the double edge-on one, is described and u sed to accurately determine the habit plane and interface of lath-shap ed or plate-like transformation products including Widmansttaten preci pitate, lath martensite and bainite plate. The results of measurements for four alloys and steels are presented; and the measured habit plan e and interface were found in most cases in excellent agreement with t he predictions from the relevant crystallographic theories of phase tr ansformations.