A combination of powder x-ray and critical voltage electron diffractio
n was used to determine the lattice parameter and low-angle structure
factors of stoichiometric beta NiAl, A weighted least squares fit meth
od was used to obtain an accurate lattice parameter from the x-ray lin
e position data, and the integrated intensities were carefully analyze
d to determine the Debye-Waller factors; the latter were found to be i
n good agreement with those obtained from the electron diffraction exp
eriments. Highly accurate (errors congruent to 0.1%) low-angle structu
re factors were also obtained from the electron diffraction measuremen
ts, which were found to agree closely with first principles calculatio
ns in the local density approximation. This information reveals that b
onding in NiAl is mostly ionic with some covalent contribution.