EFFECT OF HYDROGEN TERMINATION ON THE WORK OF ADHESION BETWEEN ROUGH POLYCRYSTALLINE SILICON SURFACES

Citation
Mr. Houston et al., EFFECT OF HYDROGEN TERMINATION ON THE WORK OF ADHESION BETWEEN ROUGH POLYCRYSTALLINE SILICON SURFACES, Journal of applied physics, 81(8), 1997, pp. 3474-3483
Citations number
43
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
8
Year of publication
1997
Part
1
Pages
3474 - 3483
Database
ISI
SICI code
0021-8979(1997)81:8<3474:EOHTOT>2.0.ZU;2-B
Abstract
A novel micromachined test structure has been used to measure the work of adhesion between polycrystalline silicon surfaces. The effects of several surface treatments, including a hydrogen- and an ammonium-fluo ride-induced hydrogen termination and a hydrogen peroxide chemical oxi dation, have been investigated with these test structures, A reduction in the average apparent work of adhesion by a factor of 2000 has been observed on the NH4F-treated surface compared to the oxide-coated sur face. By using x-ray photoelectron spectroscopy and atomic force micro scopy, the observed reduction is traced to the combined effect of rite surface chemistry and topography. This work demonstrates that a hydro phobic, rough surface provides a significant reduction of the apparent work of adhesion in polysilicon micromachined devices. (C) 1997 Ameri can Institute of Physics.