Electrostriction is the basis of electromechanical coupling in all ins
ulators. The quadratic electrostrictive strain x(ij) associated with i
nduced polarization components P-k and P-l is given by x(ij) = Q(ijkl)
P(k)P(l). Two converse electrostrictive effects may also be defined. I
n this paper, some trends in structure-property relationships that gov
ern electrostriction are identified,, along with the problems that lim
it our understanding of this fundamental electromechanical property. E
lectrostrictive coefficients range from the similar to 10(-3) m(4)/C-2
in relaxer ferroelectrics to similar to 10(3) m(4)/C-2 in some polyme
rs. High-sensitivity techniques, such as interferometry or compressome
try, are necessary to accurately measure electrostrictive effects in m
ost insulators. But even in low-K dielectrics, electrostrictive stress
es may initiate breakdown in high-field environments such as microelec
tronic components with small dimensions, high-voltage insulators, or i
n high-power lasers. In polymeric materials, charge injection mechanis
ms may produce local electric field concentrations that can cause larg
e electrostrictive strains. The electromechanical properties in polyme
rs have also been observed to vary with the thickness of the specimen.
A brief description of the anharmonic nature of electrostriction and
its frequency dependence is included.