SCANNING TUNNELING SPECTROSCOPY OF AG-AS-SE ION-CONDUCTING GLASSES

Authors
OHTO M TANAKA K
Citation
M. Ohto et K. Tanaka, SCANNING TUNNELING SPECTROSCOPY OF AG-AS-SE ION-CONDUCTING GLASSES, Applied physics letters, 71(23), 1997, pp. 3409-3411
Citations number
14
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
71
Issue
23
Year of publication
1997
Pages
3409 - 3411
Database
ISI
SICI code
0003-6951(1997)71:23<3409:STSOAI>2.0.ZU;2-Q
Abstract
Electronic structures of Ag-As-Se glasses, which possess ion-hole mixe d conduction, have been studied using a scanning tunneling microscope operating in tunneling-spectroscopy modes. The tunneling spectra show marked dependence on the scan speed of tip voltage. This scan-speed de pendence appears to be caused by Ag+-ion migration which is induced by electric fields generated by tips. (C) 1997 American Institute of Phy sics.