TEMPERATURE-PROGRAMMED X-RAY PHOTOELECTRON-SPECTROSCOPY - A NEW TECHNIQUE FOR THE STUDY OF SURFACE KINETICS - COMMENT

Authors
NETTESHEIM S HANDSCHUH M ZENOBI R
Citation
S. Nettesheim et al., TEMPERATURE-PROGRAMMED X-RAY PHOTOELECTRON-SPECTROSCOPY - A NEW TECHNIQUE FOR THE STUDY OF SURFACE KINETICS - COMMENT, Surface science, 391(1-3), 1997, pp. 1249-1251
Citations number
3
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
391
Issue
1-3
Year of publication
1997
Pages
1249 - 1251
Database
ISI
SICI code
0039-6028(1997)391:1-3<1249:TXP-AN>2.0.ZU;2-O
Abstract
It is possible to record time-resolved XPS spectra with standard equip ment, provided a modern computer-interfaced energy analyzer is used. A high emissivity beamline, as stipulated by Baraldi et al. [Surf. Sci. 367 (1997) L67] is not always necessary. This is demonstrated by a st udy on thermal desorption of thin poly-(ethylene glycol) films on sili ca. (C) 1997 Elsevier Science B.V.