HIGH-RESOLUTION ELECTRON-MICROSCOPY OF BO UNDARY-LAYERS IN CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICON

Authors
Citation
D. Wittorf et W. Jager, HIGH-RESOLUTION ELECTRON-MICROSCOPY OF BO UNDARY-LAYERS IN CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICON, European journal of cell biology, 74, 1997, pp. 55-55
Citations number
NO
Categorie Soggetti
Cell Biology
ISSN journal
01719335
Volume
74
Year of publication
1997
Supplement
45
Pages
55 - 55
Database
ISI
SICI code
0171-9335(1997)74:<55:HEOBUI>2.0.ZU;2-#